EDN

ESD protection design for discrete semiconductors

Electrostatic discharge (ESD) is caused by the discharge of an excess or deficiency of electrons on one surface with respect to another surface or to ground. When a static charge is present on an ...
Electronic Design

Charged Device Model (CDM) ESD Testing: Getting a Clearer Picture

Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...
Design-Reuse

Apache Introduces PathFinder, the Industry's First Full-chip ESD Physical Integrity Solution

San Jose, Calif. – May 10, 2010 – Apache Design Solutions, the technology leader in power integrity and noise closure for chip-package-systems (CPS) convergence, today announced PathFinder™, a ...
EDN

ESD protection of discrete semiconductors

Electrostatic discharge (ESD) is caused by the discharge of an excess or deficiency of electrons on one surface with respect to another surface or to ground. When a static charge is present on an ...