Interesting Engineering on MSN
Korean scientists detect hidden defects in solar cells with 1,000x sensitivity boost
Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
Morning Overview on MSN
Scientists crack 3-qubit quantum register on a tiny silicon photonic chip
Quantum engineers have now demonstrated a fully controllable three‑qubit register on a silicon photonic chip, turning a ...
Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...
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