Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

When a power plant experiences issues with performance, the obvious indicators are usually a loss in load capacity or an increase in fuel consumption. However, other issues exist that can be costly, ...