EDN

Handheld eye pattern analyzer conducts physical layer eye pattern measurements on the high speed interfaces

Anritsu Company introduces the Bit Master MP1026A Eye Pattern Analyzer, the first handheld solution for conducting physical layer (PHY) eye pattern measurements on the high speed interfaces at ...
Nature

Pattern electroretinogram association with spectral domain-OCT structural measurements in glaucoma

To describe the association between pattern electroretinogram (PERG) amplitude and spectral domain-optical coherence tomography (SD-OCT) macular thickness, retinal nerve fibre layer (RNFL) thickness ...
EDN

Rasterizers add eye and jitter measurements, ARIB support

Tektronix has announced new capabilities for the WVR7100 and WVR6100 rasterizers, including eye-pattern display, jitter-measurement support, and cable-length measurement capability for high definition ...
Business Wire

Anritsu Company Introduces Single Instrument That Conducts BER Measurements and Eye Pattern Analysis Simultaneously

SAN DIEGO--(BUSINESS WIRE)--Anritsu Company introduces the MP2100A BERTWave series that features a single-instrument solution that can conduct 10 Gbit/s BER measurements and eye pattern analysis ...