The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
Goethe University Frankfurt (Germany) ceremonially commissioned a state-of-the-art cryo plasma-FIB scanning electron microscope with nanomanipulator worth more than 5 million euros on Thursday. The ...
CRANBERRY TOWNSHIP, Pa.--(BUSINESS WIRE)--TESCAN, a leading global supplier of scanning electron microscopes and focused ion beam workstations has delivered a LYRA FIB-SEM workstation to UNH’s ...
No longer must you choose either SEM or FIB for failure analysis. Now there�s in situ testing using a dual-beam FIB/SEM tool. Traditionally, testing and failure analysis of integrated circuits (ICs) ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results