Boundary scan (IEEE 1149.1) evolved as a board-level test method, but new developments are making the technology attractive for embedded and system-level test and in-system programming operations.

Since its ratification in the early 1990s, the IEEE 1149.1 Boundary Scan (JTAG) specification has shown that a well-thought-out standard can be resilient, adaptive, and quite useful in applications ...

Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...

Boundary scan emerged in the 1980s as a way to measure continuity along circuit-board traces and into the I/O pins of devices soldered to the PCBs—all without external probing. Initial work by the ...