Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Silicon carbide (SiC) is a crystalline material utilized to develop a wide array of electronic devices, including transistors and other high-power, high-frequency, and high-temperature devices. As ...

TEM works by accelerating electrons, typically with energies between 80 and 300 kV, and directing them through a specimen thin enough for electron transmission. Because of their very short wavelength ...